FIM: Frustrated Total Internal Reflection Based Imaging for Biomedical Applications
Risse B, Jiang X, Klämbt C
Research article (journal) | Peer reviewedDetails about the publication
Volume: 95
Issue: Image Understanding
Page range: 11-12
Status: Published
Release year: 2013
Language in which the publication is written: English
Authors from the University of Münster
| Jiang, Xiaoyi | Professur für Praktische Informatik (Prof. Jiang) |
| Klämbt, Christian | Professorship of Neuro- and Behavioral Biology (Prof. Klämbt) |
| Risse, Benjamin | Professur für Praktische Informatik (Prof. Jiang) |