Chemical Diffusion in CuInS2 in the Temperature Range of 20°C to 100°C

Kleinfeld, M; Wiemhöfer, H.-D.

Abstract

Measurements of steady state current voltage relation and transient resistance with point electrodes on CuInS2 showed effects of ionic mobility at low temperature due to mobile copper ions. From the form of the steady state current voltage relation it was concluded that increasing copper concentration leads to a change from p- to n-type conduction in CuInS2 at the contact with the point electrode. From transient measurements, chemical diffusion coefficients of copper were derived which increase with decreasing electrical conductivity of CuInS2. At 20°C, 1.1 · 10−7 cm2/s was measured on a sample with a conductivity of 0.64 (Ω cm)−1, another sample with 21 (Ω cm)−1 gave 2.1 · 10−1 cm2/s.