Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study

Runte S, Lazić P, Vo-Van C, Coraux J, Zegenhagen J, Busse C

Research article (journal)

Abstract

Graphene on Ir(111) is studied using scanning tunneling microscopy (STM) and x-ray standing waves (XSW). The graphene layer has a corrugated shape due to the moiré pattern formed as a result of a spatially varying interaction strength between graphene and its substrate. The coherent fraction F(111) determined in XSW allows us to determine the amplitude of this intrinsic corrugation when the incoherent contributions of wrinkles, step edges, graphene edges, and contaminations are taken into account. The corrugation is found to depend on the stress state of the carbon sheet. Using density functional theory (DFT) calculations, we show that graphene can compensate stress by increasing its corrugation rather than by a reduction of the C-C bond length.

Details zur Publikation

Release year: 2014
Language in which the publication is written: English
Link to the full text: http://www.scopus.com/inward/record.url?eid=2-s2.0-84899742768&partnerID=40&md5=d6faf6ae8ee00c6fd45f2901f414cedd