Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

Heile A, Lipinsky D, Wehbe N, Delcorte A, Bertrand P, Felten A, Houssiau L, Pireaux J-J, De Mondt R, Van Vaeck L, Arlinghaus HF

Research article (journal)

Details zur Publikation

Pages: 3
Release year: 2008
Link to the full text: http://www.scopus.com/inward/record.url?partnerID=yv4JPVwI&eid=2-s2.0-56449119808&md5=a6fd1ac0396de05b3ee4dea9be590b2c