Learned Random Label Predictions as a Neural Network Complexity Metric

Becker, Marlon; Risse, Benjamin

Research article in digital collection (conference) | Peer reviewed

Abstract

We empirically investigate the impact of learning randomly generated labels in parallel to class labels in supervised learning on memorization, model complexity, and generalization in deep neural networks. To this end, we introduce a multi-head network architecture as an extension of standard CNN architectures. Inspired by methods used in fair AI, our approach allows for the unlearning of random labels, preventing the network from memorizing individual samples. Based on the concept of Rademacher complexity, we first use our proposed method as a complexity metric to analyze the effects of common regularization techniques and challenge the traditional understanding of feature extraction and classification in CNNs. Second, we propose a novel regularizer that effectively reduces sample memorization. However, contrary to the predictions of classical statistical learning theory, we do not observe improvements in generalization.

Details about the publication

Name of the repositoryOpenReview
StatusPublished
Release year2024
ConferenceWorkshop on Scientific Methods for Understanding Deep Learning @NeurIPS , Vancouver, Canada
Link to the full texthttps://openreview.net/pdf?id=dPLmqmNXdw
KeywordsDeep Learnin; Random Labels; Generalization; Overfitting

Authors from the University of Münster

Becker, Marlon
Professorship of Geoinformatics for Sustainable Development (Prof. Risse)
Risse, Benjamin
Professorship of Geoinformatics for Sustainable Development (Prof. Risse)