Combination of micro X-ray fluorescence spectroscopy and time-of-flight secondary ion mass spectrometry imaging for the marker-free detection of CeO2 nanoparticles in tissue sections

Veith L, Dietrich D, Vennemann A, Breitenstein D, Engelhard C, Karst U, Sperling M, Wiemann M, Hagenhoff B

Research article (journal) | Peer reviewed

Details about the publication

JournalJournal of Analytical Atomic Spectrometry
Volume33
Issue3
Page range491-501
StatusPublished
Release year2018
Language in which the publication is writtenEnglish
DOI10.1039/c7ja00325k

Authors from the University of Münster

Dietrich, Dörthe
Professur für Analytische Chemie (Prof. Karst)
Karst, Uwe
Professur für Analytische Chemie (Prof. Karst)
Sperling, Michael
Professur für Analytische Chemie (Prof. Karst)
Veith, Lothar
Professur für Analytische Chemie (Prof. Karst)